- Analysis of waters samples form main inorganic components to trace elements
- Multi element analysis on highly sensitive materials in water, soil and biomass samples
- Determination of elemental composition in solid and liquid samples
- Helios NanoLab™ 600i - Advanced DualBeam™ for ultra-high resolution imaging, analysis and fabrication at the nanoscale. Offering advances in the ion beam, electron beam, patterning and a range of features to make milling, imaging, analysis and sample preparation down to a nanoscale, standard applications in the lab.
- Materials and nanostructures analysis with high-resolution diffractometer “SmartLab”
- High energy resolution Wavelength-Dispersive (WD) XRF “ZSX 400”.
- Spectroscopic Ellipsometer “GES 5E”
- Micro-Raman Spectrometer
